| 摘要 |
FIELD: transport. ^ SUBSTANCE: invention relates to spaceship components and equipment. Proposed method comprises determining intensity of faults, spaceship operating life, eliminating revealed defects and perfecting spaceship and its onboard equipment. Note here that input and output electro technical parameters of optoelectronic hardware (OEH) are diagnosed, dynamics of their variations and effects of said variations on OEH detecting ability are determined. Cause-effect relations between said variations and said OEH parameters influenced by ionising radiation, SHF and optical electromagnetic radiation are defined. Control effects on OEH parameters are automatically generated in feedback circuits between inputs and outputs of elements and OEH units. Said parameters are adjusted to level that allows their compensation in operating conditions. Control process is controlled by software means at spaceship flight control center. Influence of external factors may be simulated by electric potential fro electric power source. Note here that OEH elements and units may be subjected to accelerated tests with duration notably shorter than that of external effects. ^ EFFECT: higher spaceship efficiency in long-term flights, possibility to perform OEH accelerated tests in wide range of operating performances. ^ 6 cl, 7 dwg, 1 tbl |
