发明名称 SEMICONDUCTOR DEVICE HAVING A BURIED GATE PATTERN INCLUDING HIGH-K DIELECTRIC CAPPING LAYER AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A semiconductor device with a buried gate pattern including a high-k dielectric protection film pattern and a manufacturing method thereof are provided to form a low dielectric material film on a high dielectric material film to decrease electric fields in source/drain areas, thereby preventing leaked currents. CONSTITUTION: A gate trench is formed on a substrate(10). A buried gate electrode(16) partially fills the gate trench. A protection film pattern(20a) is formed in the gate trench. Source/drain areas(22,24) are formed under the surface of the substrate adjacent to both sides of the buried gate electrode. A gate insulating film(18a) is interposed between the trench and the buried gate electrode.
申请公布号 KR20110083345(A) 申请公布日期 2011.07.20
申请号 KR20100003526 申请日期 2010.01.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MOON, JOON SEOK;WOO, DONG SOO;KAHNG, JAE ROK;LEE, JIN WOO;PARK, KEE SHIK
分类号 H01L29/78 主分类号 H01L29/78
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