发明名称 SAMPLE ANALYSIS SYSTEM
摘要 An apparatus for analyzing a sample, the apparatus comprising a first clamping chuck adapted for receiving a first portion of the sample, a second clamping chuck adapted for receiving a second portion of the sample, a first measurement unit adapted for measuring an oscillation, particularly a self-oscillation, of the sample and being coupled to the first clamping chuck, and a second measurement unit adapted for measuring the oscillation of the sample and being coupled to the second clamping chuck, wherein the first measurement unit is coupled to the first clamping chuck and the second measurement unit is coupled to the second clamping chuck so that measurement signals captured by the first measurement unit and by the second measurement unit are indicative of the oscillation along the sample.
申请公布号 EP2344859(A2) 申请公布日期 2011.07.20
申请号 EP20090744349 申请日期 2009.10.30
申请人 MONTANUNIVERSITAET LEOBEN 发明人 FROESCHL, JUERGEN;EICHLSEDER, WILFRIED
分类号 G01N3/00;G01N3/04 主分类号 G01N3/00
代理机构 代理人
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