发明名称 Semiconductor device and method of fabricating the same
摘要 A protective film (56) having a water/hydrogen blocking function is formed so as to cover the periphery of a pad electrode (54a) while being electrically isolated from the pad electrode. A material selected in the embodiment for composing the protective film is a highly moisture-proof material having a water/hydrogen blocking function considerably superior to that of the insulating material, such as palladium (Pd) or palladium-containing material, and iridium (Ir) or iridium oxide (IrOx: typically x=2) or an iridium- or iridium oxide-containing material. An FeRAM capable of reliably preventing water/hydrogen from entering inside, and of maintaining high performance of the ferroelectric capacitor structure (30) may be realized only by a simple configuration.
申请公布号 US7982254(B2) 申请公布日期 2011.07.19
申请号 US20080969019 申请日期 2008.01.03
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 NAGAI KOUICHI;SATO KATSUHIRO;SUGAWARA KAORU;TAKAHASHI MAKOTO;KUDOU MASAHITO;ASAI KAZUHIRO;MIYAZAKI YUKIMASA;SAIGOH KAORU
分类号 H01L29/76 主分类号 H01L29/76
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