发明名称 Method and apparatus for employing previous test insertion results for testing a device
摘要 A method includes determining at least a first characteristic of a device during a first test insertion and storing the first characteristic. The device is identified during a second test insertion. The first characteristic is retrieved responsive to the identification of the device. A test program for the second insertion is configured based on the first characteristic. The configured test program is executed to test the device during the second test insertion.
申请公布号 US7983871(B2) 申请公布日期 2011.07.19
申请号 US20070849735 申请日期 2007.09.04
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KIMBROUGH DOUGLAS C.;RETERSDORF MICHAEL A.;LENSING KEVIN R.
分类号 G01R31/00 主分类号 G01R31/00
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