| 摘要 |
An X-ray inspection apparatus detects, by an X-ray line sensor, X-rays irradiated towards a product placed on a conveyor and transmitted therethrough in order to detect the presence of foreign matter contained in the product. The X-ray inspection apparatus includes a determination unit and a calibrating unit. The determination unit is configured to determine, based on detection results by a line sensor obtained at each of prescribed positions of the conveyor, whether each of the prescribed positions of the conveyor is an appropriate position for calibrating the line sensor. The calibrating unit is configured to calibrate the line sensor based on detection results obtained by the line sensor at a position that is determined by the determination unit to be the appropriate position for calibrating the line sensor.
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