发明名称 SEMICONDUCTOR TRANSISTOR DEVICE STRUCTURE WITH BACK SIDE GATE CONTACT PLUGS, AND RELATED MANUFACTURING METHOD
摘要 A method of fabricating a semiconductor device with back side conductive plugs is provided here. The method begins by forming a gate structure overlying a semiconductor-on-insulator (SOI) substrate. The SOI substrate has a support layer, an insulating layer overlying the support layer, an active semiconductor region overlying the insulating layer, and an isolation region outboard of the active semiconductor region. A first section of the gate structure is formed overlying the isolation region and a second section of the gate structure is formed overlying the active semiconductor region. The method continues by forming source/drain regions in the active semiconductor region, and thereafter removing the support layer from the SOI substrate. Next, the method forms conductive plugs for the gate structure and the source/drain regions, where each of the conductive plugs passes through the insulating layer.
申请公布号 US2011169084(A1) 申请公布日期 2011.07.14
申请号 US20100687610 申请日期 2010.01.14
申请人 GLOBALFOUNDRIES INC. 发明人 YANG BIN;PAL ROHIT;HARGROVE MICHAEL
分类号 H01L29/786;H01L21/86;H01L27/12 主分类号 H01L29/786
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