发明名称 METHOD FOR TESTING NONLINEARITY ERROR OF HIGH SPEED DIGITAL-TO-ANALOG CONVERTER
摘要 A novel method applies the down-conversion sampling technology to test a high-speed digital-to-analog conversion. In the method, a digital-to-analog conversion output signal of a high-speed digital-to-analog converter and a low-frequency sinusoidal carrier wave signal input to a comparator to obtain a low-speed pulse signal. Therefore, the variation of the pulse width of the low-speed pulse signal can be measured by a common logic analyzer to assess the nonlinearity error of the high-speed digital-to-analog converter.
申请公布号 US2011169671(A1) 申请公布日期 2011.07.14
申请号 US20100684364 申请日期 2010.01.08
申请人 LIN CHUN-WEI;LIN SHENG-FENG 发明人 LIN CHUN-WEI;LIN SHENG-FENG
分类号 H03M1/10 主分类号 H03M1/10
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