发明名称 SURFACE POSITION DETECTING DEVICE, ALIGNING METHOD AND APPARATUS, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To improve measurement precision by reducing drifting of measurements, when detecting a surface position of a surface to be inspected using an oscillating mirror. <P>SOLUTION: An AF system 90 for detecting surface position information of a surface to be inspected includes a projection system 90a for obliquely projecting detection light DL on the surface to be inspected, a light-receiving system 90b for receiving detection light reflected on the surface to be inspected, an oscillating mirror 38 having a movable part with a reflection plane formed for reflecting the detection light DL within the projection system 90a and a pair of supporting parts for supporting the movable part, a holding member 48 to which the support parts of the oscillating mirror 38 are fixed, a driving section 49 for oscillating the movable part of the oscillating mirror 38, and a signal processing system 25 for processing a detection signal obtained by the light-receiving system 90b, in synchronization with the oscillation of the movable part. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011138995(A) 申请公布日期 2011.07.14
申请号 JP20090299278 申请日期 2009.12.29
申请人 NIKON CORP 发明人 ISHIKAWA MOTOHIDE;KASAI NORIAKI
分类号 H01L21/027;G01B11/00;G03F9/02;H01L21/68 主分类号 H01L21/027
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