| 摘要 |
A plasma-based dielectric barrier discharge (DBD) ion source is configured for flowing afterglow sampling and ionization of analytes. A method of direct sampling for mass spectrometric analysis includes providing an afterglow from a dielectric barrier discharge (DBD) plasma device, directing the afterglow with a flow of heated plasma support gas to a sample positioned externally to the DBD device, ionizing at least a portion of the sample with the afterglow and heated gas, and, analyzing ionized species from the sample in a mass spectrometer. A system for mass spectrometric analysis of a sample includes a mass spectrometer having an entrance aperture, and, a dielectric barrier discharge (DBD) ion source having a heated plasma support gas for directing DBD afterglow to a sample positioned between the DBD ion source and the entrance aperture of the mass spectrometer.
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