发明名称 METHODS AND APPARATUS OF FLUORINE PASSIVATION
摘要 The present disclosure provides methods and apparatus of fluorine passivation in IC device fabrication. In one embodiment, a method of fabricating a semiconductor device includes providing a substrate and passivating a surface of the substrate with a mixture of hydrofluoric acid and alcohol to form a fluorine-passivated surface. The method further includes forming a gate dielectric layer over the fluorine-passivated surface, and then forming a metal gate electrode over the gate dielectric layer. A semiconductor device fabricated by such a method is also disclosed.
申请公布号 US2011169104(A1) 申请公布日期 2011.07.14
申请号 US20100687574 申请日期 2010.01.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 XU JEFF J.;YAO LIANG-GI;KUAN TA-MING
分类号 H01L29/78;H01L21/28 主分类号 H01L29/78
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