| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device for easily detecting the location of a failure. SOLUTION: The semiconductor device 300 includes: a test circuit 301 for generating an address of 1 of a storage circuit 302, input data to input the address of 1, and an expected value to be output from the address of 1; a comparator circuit 303 for comparing the data read out from the address of 1 generated by the test circuit 301 with the expected value generated by the test circuit 301; and an output circuit 304 output from output terminals out1 to out4 by associating the address with the result compared by the comparator circuit 303. COPYRIGHT: (C)2011,JPO&INPIT
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