发明名称 Reducing Resistivity in Interconnect Structures of Integrated Circuits
摘要 An integrated circuit structure having improved resistivity and a method for forming the same are provided. The integrated circuit structure includes a dielectric layer, an opening in the dielectric layer, an oxide-based barrier layer directly on sidewalls of the opening, and conductive materials filling the remaining portion of the opening.
申请公布号 US2011171826(A1) 申请公布日期 2011.07.14
申请号 US201113036599 申请日期 2011.02.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG CHENG-LIN
分类号 H01L21/768 主分类号 H01L21/768
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