发明名称 SEMICONDUCTOR ELEMENT, SEMICONDUCTOR DEVICE, AND METHODS FOR MANUFACTURING THEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a top-gate type semiconductor element using an oxide semiconductor having a short channel length L to allow refining, and to provide a method for manufacturing the same. <P>SOLUTION: The semiconductor element includes an oxide semiconductor layer 107 on an insulating surface, a source electrode layer 109a and a drain electrode layer 109b on the oxide semiconductor layer, a gate insulating layer on the oxide semiconductor layer and the source and drain electrode layers, and a gate electrode layer on the gate insulating layer. The source and drain electrode layers have sidewalls and the sidewalls are in contact with an upper surface of the oxide semiconductor layer. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011139055(A) 申请公布日期 2011.07.14
申请号 JP20100268976 申请日期 2010.12.02
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SUZAWA HIDEOMI;KURATA MOTOMU;MIKAMI MAYUMI
分类号 H01L29/786;H01L21/28;H01L21/336;H01L29/41;H01L29/417 主分类号 H01L29/786
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