发明名称
摘要 <p>Programmable antifuse transistor, in particular n-channel MOS transistor, and a method for programming at least one such antifuse transistor, includes at least one gate with a gate terminal, source with a source terminal, drain with a drain terminal, and substrate with a substrate terminal, configured so that active circuits/circuit elements do not have to be located at a distance from the antifuse, minimizing area requirements, without additional process steps the level of the potential difference between source terminal and substrate terminal is less than about 0.5 volts, drain terminal and source terminal lie at different potentials. By adjusting drain-source voltage and/or the gate-source voltage a flow of charge carriers occurs between source and drain, causing semiconductor material between source and drain to be thermally heated and to locally melt, forming at least one permanently conducting channel between source and drain.</p>
申请公布号 JP2011520250(A) 申请公布日期 2011.07.14
申请号 JP20110504452 申请日期 2009.04.16
申请人 发明人
分类号 H01L21/82;G11C17/14;H01L27/10 主分类号 H01L21/82
代理机构 代理人
主权项
地址