发明名称 BOARD INSPECTION APPARATUS AND BOARD INSPECTION METHOD USING THE APPARATUS
摘要 PURPOSE: A substrate test device and a substrate test method using the same are provided to reduce the number of grating transfer units by grating units arranged on the same grating plane through a single grating transfer unit. CONSTITUTION: A substrate test device comprises illumination modules(100), a grating transfer unit(300), an image pickup module(400), and a control unit. Each illumination module includes an illumination unit(110), a grating unit(120) which changes the light generated by the illumination unit to the grating pattern light, and a projection lens for projecting the grating pattern light to a substrate being tested. The grating transfer unit simultaneously controls the grating units of the illumination modules predetermined times. The image pickup module photographs the grating pattern lights reflected off the substrate. The control unit inspects the substrate using the images obtained by the image pickup module.
申请公布号 KR20110080472(A) 申请公布日期 2011.07.13
申请号 KR20100000721 申请日期 2010.01.06
申请人 KOH YOUNG TECHNOLOGY INC. 发明人 HONG, JONG KYU;JEON, MOON YOUNG;KIM, HONG MIN;HUR, JUNG;YUN, SANG KYU
分类号 G01B11/25;G01B11/30;G01N21/956 主分类号 G01B11/25
代理机构 代理人
主权项
地址