发明名称 |
POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN |
摘要 |
<p>PURPOSE: A positive type resist composition and a method for forming a resist pattern are provided to improve the resist pattern shape, the thickness uniformity of pattern dimension, the line widths, and the roughness. CONSTITUTION: A positive type resist composition includes a base component. The solubility of the base component with respect to an alkaline developing agent is increased by the action of acid. An acid generating component generating acid by exposure is further included in the base component. The base component further includes fluorine-containing polymer compound generating acid by exposure. The base component includes a resin component. The resin component includes a structural unit represented by chemical formula a0-1, a structural unit derived from acrylic acid ester containing acid dissolution inhibitor. The fluorine-containing polymer compound includes a structural unit represented by chemical formula c0-1 or c0-2 and a structural unit represented by chemical formula c1.</p> |
申请公布号 |
KR20110081047(A) |
申请公布日期 |
2011.07.13 |
申请号 |
KR20100137414 |
申请日期 |
2010.12.29 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
HIRANO TOMOYUKI;SHIONO DAIJU;ARAI MASATOSHI |
分类号 |
G03F7/039;G03F7/027;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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