发明名称 Semiconductor integrated circuit, test method and electronic information device
摘要 A semiconductor integrated circuit, including: a logic section; an initiating current generating section for generating initiating current for initiating or re-initiating a circuit when the circuit is to be initiated or the circuit operates abnormally; an initiating current detecting section for detecting the initiating current of the initiating current generating section and outputting a detection signal indicating whether or not the initiating current generating section operates normally; and a signal selection section for selecting one of the detection signal and an output from the logic section based on an internal signal of the logic section which is controllable from outside of the logic section, and outputting the selected one to a terminal.
申请公布号 US7977982(B2) 申请公布日期 2011.07.12
申请号 US20060359556 申请日期 2006.02.23
申请人 SHARP KABUSHIKI KAISHA 发明人 AKAMATSU TETSUYA;SHIOE HIDEKI;MORI HARUYA
分类号 H03L7/00 主分类号 H03L7/00
代理机构 代理人
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