发明名称 Single SOI wafer accelerometer fabrication process
摘要 Methods for producing a MEMS device from a single silicon-on-insulator (SOI) wafer. An SOI wafer includes a silicon (Si) handle layer, a Si mechanism layer and an insulator layer located between the Si handle and Si mechanism layers. An example method includes etching active components from the Si mechanism layer. Then, the exposed surfaces of the Si mechanism layer is doped with boron. Next, portions of the insulator layer proximate to the etched active components of the Si mechanism layer are removed and the Si handle layer is etched proximate to the etched active components.
申请公布号 US7976714(B2) 申请公布日期 2011.07.12
申请号 US20080969505 申请日期 2008.01.04
申请人 HONEYWELL INTERNATIONAL INC. 发明人 YU LIANZHONG
分类号 C23F1/00 主分类号 C23F1/00
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