发明名称 Apparatus for controlling I/O strobe signal in semiconductor memory apparatus
摘要 A sensing enable signal control circuit determines a driving timing of an I/O sense amplifier based on a read-out result of data, which is stored in a dummy cell of a semiconductor memory apparatus. The sensing enable signal control circuit in a semiconductor memory apparatus includes a detection code generating unit configured to output a detection code according to a voltage level of dummy cell data, which are read out from a dummy cell through at least one read operation, in response to a column select enable signal, and a multiplexer configured to receive the detection code and a default code and output a delay code to delay a sensing enable signal.
申请公布号 US7978553(B2) 申请公布日期 2011.07.12
申请号 US20090493354 申请日期 2009.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM KWI DONG
分类号 G11C7/02 主分类号 G11C7/02
代理机构 代理人
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