发明名称 |
METHOD FOR MANUFACTURING AN ELECTRONIC COMPONENT, ELECTRONIC COMPONENT, PLASMA TREATMENT DEVICE, CONTROL PROGRAM, AND RECORDING MEDIUM |
摘要 |
<p>Provided is a method for manufacturing an electronic component. Said method: prevents or reduces agglomeration of a low-melting-point metal that is formed into a film at high temperatures; forms a barrier layer with sufficient barrier performance and wettability; and fills a depression with a low-melting-point metal such that said metal closely follows the contours of said depression. The provided method includes: a procedure in which a first bias power is applied to an electrode (301) in contact with an object being treated (306), under for example 4 to 20 Pa of pressure, and plasma treatment is used to form a first barrier layer (404) comprising TiNx on top of the object being treated (306); a procedure in which either no bias power or a second bias power which provides ion-injection energy but is lower than the first bias power is applied to the electrode (301) under for example 4 to 20 Pa of pressure, and plasma treatment is used to form a second barrier layer (405) comprising TiNx on top of the first barrier layer; and a procedure in which a low-melting-point metal (406) is added on top of the second barrier layer (405).</p> |
申请公布号 |
WO2011081202(A1) |
申请公布日期 |
2011.07.07 |
申请号 |
WO2010JP73772 |
申请日期 |
2010.12.28 |
申请人 |
CANON ANELVA CORPORATION;WAKAYANAGI SHUNICHI;SAITO TAKAYUKI |
发明人 |
WAKAYANAGI SHUNICHI;SAITO TAKAYUKI |
分类号 |
H01L21/285;C23C14/06;C23C14/34;H01L21/28;H01L21/3205;H01L21/768;H01L23/52 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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