发明名称 METHOD FOR MANUFACTURING AN ELECTRONIC COMPONENT, ELECTRONIC COMPONENT, PLASMA TREATMENT DEVICE, CONTROL PROGRAM, AND RECORDING MEDIUM
摘要 <p>Provided is a method for manufacturing an electronic component. Said method: prevents or reduces agglomeration of a low-melting-point metal that is formed into a film at high temperatures; forms a barrier layer with sufficient barrier performance and wettability; and fills a depression with a low-melting-point metal such that said metal closely follows the contours of said depression. The provided method includes: a procedure in which a first bias power is applied to an electrode (301) in contact with an object being treated (306), under for example 4 to 20 Pa of pressure, and plasma treatment is used to form a first barrier layer (404) comprising TiNx on top of the object being treated (306); a procedure in which either no bias power or a second bias power which provides ion-injection energy but is lower than the first bias power is applied to the electrode (301) under for example 4 to 20 Pa of pressure, and plasma treatment is used to form a second barrier layer (405) comprising TiNx on top of the first barrier layer; and a procedure in which a low-melting-point metal (406) is added on top of the second barrier layer (405).</p>
申请公布号 WO2011081202(A1) 申请公布日期 2011.07.07
申请号 WO2010JP73772 申请日期 2010.12.28
申请人 CANON ANELVA CORPORATION;WAKAYANAGI SHUNICHI;SAITO TAKAYUKI 发明人 WAKAYANAGI SHUNICHI;SAITO TAKAYUKI
分类号 H01L21/285;C23C14/06;C23C14/34;H01L21/28;H01L21/3205;H01L21/768;H01L23/52 主分类号 H01L21/285
代理机构 代理人
主权项
地址