| 摘要 |
PURPOSE: An apparatus and a method for inspecting a light emitting diode is provided to check whether or not the light emitting diode has a poor phosphor layer. CONSTITUTION: An apparatus for inspecting a light emitting diode includes an irradiation portion(130), an image acquisition part(140), and a determining unit(150). The irradiation portion irradiates ultraviolet ray to a light emitting diode having a phosphor material layer. The image acquisition part detects the visible ray emitted due to the ultraviolet ray from the fluorescent material layer. The image acquisition part acquires an image of the light emitting diode. The determining unit determines whether or not the light emitting diode is poor using the image.
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