发明名称 SKIN CHARACTERISTIC MEASURING APPARATUS, SKIN CHARACTERISTIC MEASURING METHOD, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To measure the surface elasticity and the inner hardness of the skin surface at the same time and at the same region. SOLUTION: The skin characteristic measuring apparatus 1 includes: a probe 20 to which vibration of a prescribed frequency is applied; an oscillation circuit 23 for measuring the change of the frequency of the probe 20 when the probe 20 is brought into contact with the skin surface of a subject; a strain indicator 24 for measuring the reactive force received from the skin surface when the probe 20 is pressed on the skin surface of the subject with prescribed pressure; and a skin characteristic measuring part 30 for measuring the characteristics of the skin surface based on the result of measurement by the oscillation circuit 23 and the strain indicator 24. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011130805(A) 申请公布日期 2011.07.07
申请号 JP20090290351 申请日期 2009.12.22
申请人 MORITEX CORP;KAO CORP 发明人 SHIRAI YASUO;NOJIMA JUNICHI
分类号 A61B5/00;G01N3/40;G01N33/50 主分类号 A61B5/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利