发明名称 |
DECOMPRESSOR/PRPG FOR APPLYING PSEUDO-RANDOM AND DETERMINISTIC TEST PATTERNS |
摘要 |
A novel decompressor/PRPG on a microchip performs both pseudo-random test pattern generation and decompression of deterministic test patterns for a circuit-under-test on the chip. The decompressor/PRPG has two phases of operation. In a pseudo-random phase, the decompressor/PRPG generates pseudo-random test patterns that are applied to scan chains within the circuit-under test. In a deterministic phase, compressed deterministic test patterns from an external tester are applied to the decompressor/PRPG. The patterns are decompressed as they are clocked through the decompressor/PRPG into the scan chains. The decompressor/PRPG thus provides much better fault coverage than a simple PRPG, but without the cost of a complete set of fully-specified deterministic test patterns.
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申请公布号 |
US2011167309(A1) |
申请公布日期 |
2011.07.07 |
申请号 |
US20110983815 |
申请日期 |
2011.01.03 |
申请人 |
MENTOR GRAPHICS CORPORATION |
发明人 |
RAJSKI JANUSZ;TYSZER JERZY;KASSAB MARK;MUKHERJEE NILANJAN |
分类号 |
G01R31/3177;G01R31/3183;G01R31/28;G01R31/3181;G06F11/25;H01L21/66;H01L21/822;H01L27/04 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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