发明名称 METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES INCLUDING STRUCTURES
摘要 In methods of manufacturing a semiconductor device, a plurality of gate structures spaced apart from each other and oxide layer patterns. A sputtering process using the oxide layer patterns as a sputtering target to connect the oxide layer patterns on the adjacent gate structures to each other is performed, so that a gap is formed between the gate structures. A volume of the gap is formed uniformly to have desired volume by controlling a thickness of the oxide layer patterns.
申请公布号 US2011165750(A1) 申请公布日期 2011.07.07
申请号 US20110984940 申请日期 2011.01.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG JUN-KYU;PARK YOUNG-GEUN;HWANG KI-HYUN;CHOI HAN-MEI;PARK CHAN-JIN
分类号 H01L21/336 主分类号 H01L21/336
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