发明名称 FLUORINE-CONTAINING MONOMER, FLUORINE-CONTAINING POLYMER COMPOUND, RESIST MATERIAL, AND METHOD FOR FORMING PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a monomer for producing a resin for additives of a radiation-sensitive resist material having excellent transparency and very few development defects. <P>SOLUTION: The fluorine-containing monomer is represented by general formula (1), wherein R<SP>1</SP>is a hydrogen atom, a fluorine atom, a methyl group, or a trifluoromethyl group; R<SP>2</SP>is a 1-15C straight chain, branched, or cyclic monovalent hydrocarbon group which may have a halogen atom or an oxygen atom; A is a 1-6C straight chain, branched, or cyclic bivalent hydrocarbon group; and K<SP>1</SP>is an integer of 0-2. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011132273(A) 申请公布日期 2011.07.07
申请号 JP20090290054 申请日期 2009.12.22
申请人 SHIN-ETSU CHEMICAL CO LTD 发明人 HASEGAWA KOJI;SAGEHASHI MASAYOSHI;MORISAWA HIROSHI;HARADA YUJI;YOSHIHARA TAKAO
分类号 C08F20/24;C07C69/67;G03F7/039;G03F7/38 主分类号 C08F20/24
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