发明名称 SEMICONDUCTOR CONTACT STRUCTURE AND METHOD OF FABRICATING THE SAME
摘要 Semiconductor fabricating technology is provided, and particularly, a method of fabricating a semiconductor device improving a contact characteristic between a silicon layer including carbon and a metal layer during a process of fabricating a semiconductor device is provided. A semiconductor device including the silicon layer including carbon and the metal layer formed on the silicon layer is provided. A metal silicide layer is interposed between the silicon layer including carbon and the metal layer.
申请公布号 US2011163394(A1) 申请公布日期 2011.07.07
申请号 US20100813107 申请日期 2010.06.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JOO-SUNG;PARK SE-KEUN
分类号 H01L29/78;H01L23/532 主分类号 H01L29/78
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