发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE, AND MANUFACTURING SYSTEM OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To eliminate various kinds of adverse effects in a technique for forming a mark for recognizing position, on a chip. SOLUTION: This manufacturing method of a semiconductor device includes a process wherein a semiconductor wafer 1 mounted with a plurality of semiconductor chips 2 is held by a holding ring 4 via a dicing sheet 3 to dice the semiconductor wafer 1 by dicing. Further, the method includes a process wherein the mark for recognizing position (position-recognizing mark 5) is formed on the part positioned at the outside of the semiconductor wafer 1 in the dicing sheet 3. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011135056(A) |
申请公布日期 |
2011.07.07 |
申请号 |
JP20100259790 |
申请日期 |
2010.11.22 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
SHINKAI HARUYUKI;TANAKA KOZUE;FURUTA ICHIRO;KOMIYA TOSHIYUKI |
分类号 |
H01L21/301 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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