发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE, AND MANUFACTURING SYSTEM OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To eliminate various kinds of adverse effects in a technique for forming a mark for recognizing position, on a chip. SOLUTION: This manufacturing method of a semiconductor device includes a process wherein a semiconductor wafer 1 mounted with a plurality of semiconductor chips 2 is held by a holding ring 4 via a dicing sheet 3 to dice the semiconductor wafer 1 by dicing. Further, the method includes a process wherein the mark for recognizing position (position-recognizing mark 5) is formed on the part positioned at the outside of the semiconductor wafer 1 in the dicing sheet 3. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011135056(A) 申请公布日期 2011.07.07
申请号 JP20100259790 申请日期 2010.11.22
申请人 RENESAS ELECTRONICS CORP 发明人 SHINKAI HARUYUKI;TANAKA KOZUE;FURUTA ICHIRO;KOMIYA TOSHIYUKI
分类号 H01L21/301 主分类号 H01L21/301
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