发明名称 METHOD OF MAKING A SEMICONDUCTOR STRUCTURE USEFUL IN MAKING A SPLIT GATE NON-VOLATILE MEMORY CELL
摘要 A method of making a semiconductor device on a semiconductor layer is provided. The method includes: forming a select gate dielectric layer over the semiconductor layer; forming a select gate layer over the select gate dielectric layer; and forming a sidewall of the select gate layer by removing at least a portion of the select gate layer. The method further includes growing a sacrificial layer on at least a portion of the sidewall of the select gate layer and under at least a portion of the select gate layer and removing the sacrificial layer to expose a surface of the at least portion of the sidewall of the select gate layer and a surface of the semiconductor layer under the select gate layer. The method further includes forming a control gate dielectric layer, a charge storage layer, and a control gate layer.
申请公布号 US2011165749(A1) 申请公布日期 2011.07.07
申请号 US20100683972 申请日期 2010.01.07
申请人 WINSTEAD BRIAN A;HONG CHEONG M;KANG SUNG-TAEG;LOIKO KONSTANTIN V;WILLIAMS SPENCER E 发明人 WINSTEAD BRIAN A.;HONG CHEONG M.;KANG SUNG-TAEG;LOIKO KONSTANTIN V.;WILLIAMS SPENCER E.
分类号 H01L21/336;H01L21/28 主分类号 H01L21/336
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