发明名称 PROBE DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To make a difference in the amount of displacement of a probe in relation to a probe holder as small as possible and thereby to enable correct testing. <P>SOLUTION: The probe device includes a probe assembly including a plurality of probes and a probe holder wherein the probes are disposed at intervals in the lateral direction and in an extendible manner in the fore-and-aft direction with their needle central regions opposed. Either one of the probe holder and each probe includes a downward-facing first section and a forward-facing second section, and the other of the probe holder and each probe includes an upward-facing third section which can come into contact with the first section and a backward-facing fourth section which can come into contact with the second section. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011133462(A) 申请公布日期 2011.07.07
申请号 JP20100213162 申请日期 2010.09.24
申请人 MICRONICS JAPAN CO LTD 发明人 KUGA TOMOAKI;YASUDA TAKAO;OGASAWARA JURI;KIYONO YOJI;NAKAYASHIKI YUTA;MIURA KAZUYOSHI;AKAHIRA MEGUMI
分类号 G01R1/073;G01R31/26;G02F1/13;G02F1/1368 主分类号 G01R1/073
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