发明名称 |
METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to perform isolation of an adjacent capacitor device stably, by forming an insulation pattern for capacitor isolation only on the bottom of a trench. CONSTITUTION: A trench is formed on a semiconductor substrate. An insulation film is formed so that the inside of the trench is gap-filled. A first insulation pattern is formed through a dry etching process for an insulation film. The first insulation pattern has a first thickness. A second insulation pattern(140) is formed through a wet etching process for the trench including the first insulation pattern. The second insulation pattern has a second thickness. The second thickness is smaller than the first thickness.
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申请公布号 |
KR20110076174(A) |
申请公布日期 |
2011.07.06 |
申请号 |
KR20090132810 |
申请日期 |
2009.12.29 |
申请人 |
DONGBU HITEK CO., LTD. |
发明人 |
JOO, SUNG WOOK;JUNG, CHUNG KYUNG |
分类号 |
H01L21/8242;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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