发明名称 METHOD FOR MANUFACTURING OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to perform isolation of an adjacent capacitor device stably, by forming an insulation pattern for capacitor isolation only on the bottom of a trench. CONSTITUTION: A trench is formed on a semiconductor substrate. An insulation film is formed so that the inside of the trench is gap-filled. A first insulation pattern is formed through a dry etching process for an insulation film. The first insulation pattern has a first thickness. A second insulation pattern(140) is formed through a wet etching process for the trench including the first insulation pattern. The second insulation pattern has a second thickness. The second thickness is smaller than the first thickness.
申请公布号 KR20110076174(A) 申请公布日期 2011.07.06
申请号 KR20090132810 申请日期 2009.12.29
申请人 DONGBU HITEK CO., LTD. 发明人 JOO, SUNG WOOK;JUNG, CHUNG KYUNG
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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