SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PURPOSE: A semiconductor integrated circuit is provided to improve the reliability of a probe test operation by setting a second output driver to have a driving force for operating a probe test pad and a probe. CONSTITUTION: In a semiconductor integrated circuit, a bump pad(310) outputs data. A probe test pad(340) is larger than the bump pad. A first output driver(320) drives the bump pad according to the output data with a first driving force. A second output driver(350) drives probe test pad according to the output data with a second driving force. The second driving force is higher than the first driving force. A multiplexor(360) connects the output data to the first and second driving unit in response to a test mode signal.