发明名称 |
SUBSTRATE POLISHING APPARATUS, SUBSTRATE POLISHING METHOD, AND APPARATUS FOR REGULATING TEMPERATURE OF POLISHING SURFACE OF POLISHING PAD USED IN POLISHING APPARATUS |
摘要 |
PURPOSE: A substrate polishing apparatus, a substrate polishing method, an apparatus for adjusting temperature of polishing surfaces of a polishing pad used for a polishing apparatus are provided to shorten a polishing time by optimizing polishing surfaces of a substrate. CONSTITUTION: A polishing pad(11) is attached to a polishing table(13) and can be rotated. At least one substrate holder holds a substrate so as to polish the substrate and presses a polishing surface of the polishing pad on the polishing table for rotating the substrate. A pad temperature detector detects the temperature of the polishing surface of the polishing pad. A pad temperature controller(26) comes in contact with a polishing surface of the polishing pad so as to adjust the temperature of the polishing surface. A temperature controller controls the pad temperature controller and the temperature of the polishing surface of the polishing pad. |
申请公布号 |
KR20110076784(A) |
申请公布日期 |
2011.07.06 |
申请号 |
KR20100133336 |
申请日期 |
2010.12.23 |
申请人 |
EBARA CORPORATION |
发明人 |
SONE TADAKAZU;MOTOSHIMA YASUYUKI;MARUYAMA TORU;OHNO KATSUTOSHI;SHIOKAWA YOUICHI |
分类号 |
H01L21/304;B24B37/015;B24B49/14 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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