发明名称
摘要 <p>The semiconductor device according to an aspect of the invention includes: an internal circuit area having an internal circuit; an I/O circuit area positioned outside the internal circuit area; and an electrode pad placed across an outer edge of the I/O circuit area. In the electrode pad, an area outside the outer edge of the I/O circuit area is a bonding area, and an area inside the outer edge is a probe area.</p>
申请公布号 JP4717523(B2) 申请公布日期 2011.07.06
申请号 JP20050172294 申请日期 2005.06.13
申请人 发明人
分类号 H01L23/52;H01L21/3205;H01L21/60;H01L21/66 主分类号 H01L23/52
代理机构 代理人
主权项
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