发明名称 |
In-circuit testing for integrity of solid-state switches |
摘要 |
A switching and fault detection circuit comprises two controllable switches capable of coupling a power source to a load. A controller can control the switches and test them for faults, and a voltage sensor can read the output voltage going to the load. Dual-redundant switches and fault detection circuitry can provide correct operation if one should fail. Control and feedback logic can determine if each of the solid-state switches is operating correctly during the power-on and power-off cycles and can also check for a fail-open condition during normal operations. If it is determined that a solid switch has failed open or closed, a fault can be generated.
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申请公布号 |
US7973533(B2) |
申请公布日期 |
2011.07.05 |
申请号 |
US20080038693 |
申请日期 |
2008.02.27 |
申请人 |
VERTICAL POWER, INC. |
发明人 |
AUSMAN MARC;DEVRIES KEVIN;DOSTAL JAKE |
分类号 |
G01R31/02;G01R31/26;G01R31/327 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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