发明名称 |
Metrology and registration system and method for laminography and tomography |
摘要 |
A metrology system that uses an imaging system to monitor alignment features on the sample or sample holder of an X-ray laminography or tomography system. the metrology system has the capability to provide both sample shift and sample rotation movement data to a data acquisition system. These shift and rotation data can be used in alignment routines to produce 3D reconstructions from the X-ray images/projections. The metrology system is based on an imaging and focusing measurement of intrinsic feature of the sample or artificial features fabricated on the sample or sample holder.
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申请公布号 |
US7974379(B1) |
申请公布日期 |
2011.07.05 |
申请号 |
US20090556341 |
申请日期 |
2009.09.09 |
申请人 |
XRADIA, INC. |
发明人 |
CASE THOMAS A.;YUN WENBING;LYON ALAN FRANCIS |
分类号 |
G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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