发明名称 Verification circuits and methods for phase change memory array
摘要 A verification circuit for a phase change memory array is provided. A sensing unit senses a sensing voltage from a memory cell of the phase change memory array according to an enable signal. A comparator generates a comparing signal according to the sensing voltage and a reference voltage, so as to indicate whether the memory cell is in a reset state. A control unit generates a control signal according to the enable signal. An operating unit generates a first signal according to the control signal, so as to indicate whether the comparator is active. An adjustment unit provides a writing current to the cell, and increases the writing current according to the control signal until the comparing signal indicates that the memory cell is in a reset state.
申请公布号 US7974122(B2) 申请公布日期 2011.07.05
申请号 US20090485720 申请日期 2009.06.16
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 LIN WEN-PIN;SHEU SHYH-SHYUAN;CHIANG PEI-CHIA
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
主权项
地址