发明名称 Operation methods for memory cell and array for reducing punch through leakage
摘要 A method for programming a first memory cell in a memory array. In a specific embodiment, each memory cell has a drain, a source, a channel, and a control gate overlying a charge storage material and the channel. The source of the first memory cell is coupled to the drain of a second memory cell. A voltage is applied to the drain of the first memory cell, and the source of the second memory cell is grounded. The method includes floating the drain of the second memory cell and the source of the first memory cell and turning on the channels of the first and second memory cells, effectively forming an extended channel region. Hot carriers are injected to the charge storage material of the first cell to program the first memory cell. The extended channel lowers electrical fields and reduces punch through leakage in unselected memory cells.
申请公布号 US7974127(B2) 申请公布日期 2011.07.05
申请号 US20080264886 申请日期 2008.11.04
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 CHONG LIT-HO;TSAI WEN-JER;OU TIEN-FAN;HUANG JYUN-SIANG
分类号 G11C11/34 主分类号 G11C11/34
代理机构 代理人
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