发明名称 SLIT POSITION CONTROL METHOD AND DEVICE OF MONOCHROMATOR, AS WELL AS ANALYTICAL ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a slit position control method and its device of a monochromator enabled to carry out adjustment of a monochromator in a short time, in the slit position control device of a monochromator. SOLUTION: The monochromator including an energy filter for generating energy dispersion by receiving incident charged particle beams, and extracting electron beams with a desired energy width through energy selecting slits fitted on an energy dispersion surface, is structured having a current detection means 4 for detecting a current flowing in the energy selecting slits 22, and a slit position control means 5 for controlling a position of the energy selecting slits 22 so as to have the current value detected by the current detection means 4 minimum. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011129257(A) 申请公布日期 2011.06.30
申请号 JP20090283732 申请日期 2009.12.15
申请人 JEOL LTD 发明人 MUKAI MASAKI
分类号 H01J37/244;H01J37/05;H01J37/26;H01J37/28;H01J49/46 主分类号 H01J37/244
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