| 摘要 |
PURPOSE: A fuse set of a semiconductor memory and a repair determination circuit using the same are provided to reduce current consumption by reducing the area of a repair determination circuit. CONSTITUTION: In a fuse set of a semiconductor memory and a repair determination circuit using the same, a repair discrimination circuit(100) arranges a fuse set group of a first to a fourth quarter block. The fuse set group(FSGC Q0) is related to a first quarter block(Q0 U/Q0 D). A fuse set group(FSGC Q1) is related to a second quarter block(Q1 U/Q1 D). A fuse set group(FSGC Q2) is related to a third quarter block(Q2 U/Q2 D). A fuse set group(FSGC Q3) is related to a fourth quarter block(Q3 U/Q3 D). The fuse set group comprises N fuse sets.
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