发明名称 VACUUM PROCESSING APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a vacuum processing apparatus that suppresses a decrease in film quality at the periphery of a substrate due to distribution of film formation conditions by increasing the flow rate of exhaust gas discharged from a slit between discharge electrodes by reducing an exhaust gas flow of gas having not contributed to film formation and flowing to the periphery of the substrate. <P>SOLUTION: The vacuum processing apparatus 1A that jets film forming gas from the discharge electrodes 6 and performs decomposition of the film forming gas and radical generation in a plasma atmosphere of the discharge electrodes 6 to subject the substrate to vacuum plasma processing includes a gas block barrier structure portion that increases pressure drop of a gas flow passage by: fitting a gas block barrier material 30 for narrowing down the inter-plane distance between a substrate table and the discharge electrodes 6 to the peripheral edge of the substrate table at a predetermined distance from the substrate; and narrowing down the inter-passage-plane width of a flow of gas flowing from the plasma atmosphere to the back of a sticking-preventive plate 7 or a vacuum discharge portion via the end of the substrate. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011129703(A) 申请公布日期 2011.06.30
申请号 JP20090286661 申请日期 2009.12.17
申请人 MITSUBISHI HEAVY IND LTD 发明人 SASAGAWA EISHIRO;OTSUBO EIICHIRO
分类号 H01L21/205;C23C16/455;H01L21/31;H01L31/04 主分类号 H01L21/205
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