发明名称 |
VACUUM PROCESSING APPARATUS |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a vacuum processing apparatus that suppresses a decrease in film quality at the periphery of a substrate due to distribution of film formation conditions by increasing the flow rate of exhaust gas discharged from a slit between discharge electrodes by reducing an exhaust gas flow of gas having not contributed to film formation and flowing to the periphery of the substrate. <P>SOLUTION: The vacuum processing apparatus 1A that jets film forming gas from the discharge electrodes 6 and performs decomposition of the film forming gas and radical generation in a plasma atmosphere of the discharge electrodes 6 to subject the substrate to vacuum plasma processing includes a gas block barrier structure portion that increases pressure drop of a gas flow passage by: fitting a gas block barrier material 30 for narrowing down the inter-plane distance between a substrate table and the discharge electrodes 6 to the peripheral edge of the substrate table at a predetermined distance from the substrate; and narrowing down the inter-passage-plane width of a flow of gas flowing from the plasma atmosphere to the back of a sticking-preventive plate 7 or a vacuum discharge portion via the end of the substrate. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2011129703(A) |
申请公布日期 |
2011.06.30 |
申请号 |
JP20090286661 |
申请日期 |
2009.12.17 |
申请人 |
MITSUBISHI HEAVY IND LTD |
发明人 |
SASAGAWA EISHIRO;OTSUBO EIICHIRO |
分类号 |
H01L21/205;C23C16/455;H01L21/31;H01L31/04 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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