发明名称 DEVICE AND METHOD OF MARKING IDENTIFICATION CODE AND SEMICONDUCTOR DEVICE MARKED WITH IDENTIFICATION CODE
摘要 PROBLEM TO BE SOLVED: To solve such a problem that there is a higher possibility of causing a dead pixel, a dropout, and a fall to a part of identification codes when a force is applied from the outside as a ratio (so-called aspect ratio) of a height to a bottom area of a dot when overgrazing the dot in order to improve visibility in the identification code that is marked on the semiconductor device. SOLUTION: In a device and a method of marking an identification code on a semiconductor device, a groove filling material is applied over the identification code or the identification codes are laminated and formed in such a manner as to reduce height differences at the recessed/projected portion of the identification code. Furthermore, the semiconductor device is marked with the identification code. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011129617(A) 申请公布日期 2011.06.30
申请号 JP20090284904 申请日期 2009.12.16
申请人 TORAY ENG CO LTD 发明人 INAKA CHIGUSA
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
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