发明名称 BURIED GATE IN SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 A buried gate in a semiconductor device and a method for fabricating the same are presented. The method includes: forming a gate trench in an active region of a semiconductor substrate; filling the gate trench with a barrier metal film and a metal film; recessing the metal film and the barrier metal film to form buried gate electrodes that partially fill the gate trench; recessing the barrier metal film of the buried gate electrode below the surface of the metal film; and filling an exposed part of the buried gate electrode and the gate trench with a capping film.
申请公布号 US2011156135(A1) 申请公布日期 2011.06.30
申请号 US20100834127 申请日期 2010.07.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON HYO GEUN;PARK JI YONG;LEE SUN JIN
分类号 H01L29/78;H01L21/28 主分类号 H01L29/78
代理机构 代理人
主权项
地址