发明名称 X-RAY ANALYZING DISPLAY PROCESSOR
摘要 PROBLEM TO BE SOLVED: To improve efficiency and accuracy for analyzing a phase by displaying absolute value information on the strength of three elements which cannot be conventionally expressed by a ternary scatter chart. SOLUTION: Axes (A axis, B axis and C axis) for expressing relative values as the strength of three elements normalized by a strength sum are allocated to three sides of an equilateral triangle. An axis (D axis) for expressing the sum of the strength of three elements is added in a direction orthogonal to a plane for placing the equilateral triangle so as to form a triangle pole three-dimensional space. The triangle pole three-dimensional space is configured as a space for being plotted with a data point obtained in one minute region in a mapping analysis. The three-dimensional graph is flattened so as to be rendered on a screen of a display section. A position of the data point on the conventional ternary scatter chart can be obtained by arbitrarily changing a direction for viewing the three-dimensional graph. Absolute values of the strength of three elements can be easily known. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011127995(A) 申请公布日期 2011.06.30
申请号 JP20090286395 申请日期 2009.12.17
申请人 SHIMADZU CORP 发明人 ISHIKAWA TAKEHIRO
分类号 G01N23/225 主分类号 G01N23/225
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