发明名称 ILLUMINATION SYSTEM FOR MICROLITHOGRAPHY
摘要 Microlithographic projection exposure apparatus comprising an illumination device and ex projection objective), wherein, during the operation of the projection exposure apparatus, the illumination device an least partly illuminates a reticle in an object plane or the projection objective and the projection objective images this illuminated part of this object plane with a scale M onto at least one part of the wafer in the image plane, and wherein the wafer can be moved synchronously with the reticle perpendicular to the optical axis and providing a fly' s eye condenser for illuminating a plane.
申请公布号 WO2011039261(A3) 申请公布日期 2011.06.30
申请号 WO2010EP64467 申请日期 2010.09.29
申请人 CARL ZEISS SMT GMBH;KIRCH, MARC;FIOLKA, DAMIAN;ZIEGLER, GERHARD-WILHELM;DEGUENTHER, MARKUS;SCHWAB, MARKUS 发明人 KIRCH, MARC;FIOLKA, DAMIAN;ZIEGLER, GERHARD-WILHELM;DEGUENTHER, MARKUS;SCHWAB, MARKUS
分类号 G03F7/20;G02B27/09;G02B27/18 主分类号 G03F7/20
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