Microlithographic projection exposure apparatus comprising an illumination device and ex projection objective), wherein, during the operation of the projection exposure apparatus, the illumination device an least partly illuminates a reticle in an object plane or the projection objective and the projection objective images this illuminated part of this object plane with a scale M onto at least one part of the wafer in the image plane, and wherein the wafer can be moved synchronously with the reticle perpendicular to the optical axis and providing a fly' s eye condenser for illuminating a plane.
申请公布号
WO2011039261(A3)
申请公布日期
2011.06.30
申请号
WO2010EP64467
申请日期
2010.09.29
申请人
CARL ZEISS SMT GMBH;KIRCH, MARC;FIOLKA, DAMIAN;ZIEGLER, GERHARD-WILHELM;DEGUENTHER, MARKUS;SCHWAB, MARKUS
发明人
KIRCH, MARC;FIOLKA, DAMIAN;ZIEGLER, GERHARD-WILHELM;DEGUENTHER, MARKUS;SCHWAB, MARKUS