发明名称 TEST SUPPORT DEVICE FOR OPTIMIZING TEST SCENARIO TO MINIMIZE TOTAL TEST TIME, TEST DEVICE, TEST SUPPORT METHOD, AND COMPUTER PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a test support device, a test device, a test support method and a computer program which can appropriately select a test node for obtaining a snapshot so that a test can be completed in the minimum time along all of test scenarios. SOLUTION: Information regarding test scenarios, information regarding a test node to which transition should be performed next, etc. are stored. It is determined whether a branch path exists for each test node, and in the test node in which it is determined that the branch path exists, execution prediction time, required until the test is completed, is calculated when the snapshot is obtained. Execution time, required until the test is completed, is calculated without obtaining the snapshot, and difference between the execution time and the execution prediction time is calculated as shortening time. A test node with the largest shortening time is selected, and information for identifying the selected test node is output. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011129028(A) 申请公布日期 2011.06.30
申请号 JP20090288976 申请日期 2009.12.21
申请人 INTERNATL BUSINESS MACH CORP 发明人 SHINKAWA KAORI;TAWARA YOSHINORI;BHANDARI SAKURA;NISHIKAWA YURIKO
分类号 G06F11/28 主分类号 G06F11/28
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