| 摘要 |
PROBLEM TO BE SOLVED: To provide a technique for confirming whether a semiconductor memory device that performs a high-speed operation on a semiconductor device performs the desired operation, even with the actual specification frequencies. SOLUTION: In the semiconductor device 827 having the semiconductor memory device 822 and a logic circuit 123, the semiconductor memory device 822 includes two memory array regions 802a and 802b. The two memory array regions are configured such that an output of one memory array region is to be an input of the other memory array region, while each of the read and write control is to be converted to operate inversely, so that the semiconductor memory device 822 is enabled to perform self-inspection by itself. COPYRIGHT: (C)2011,JPO&INPIT
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