发明名称 High Temperature Anneal for Aluminum Surface Protection
摘要 The present disclosure also provides another embodiment of a method for making metal gate stacks. The method includes forming a first dummy gate and a second dummy gate on a substrate; removing a polysilicon layer from the first dummy gate, resulting in a first gate trench; forming a first metal layer and a first aluminum layer in the first gate trench; applying a chemical mechanical polishing (CMP) process to the substrate; performing an annealing process to the first aluminum layer using a nitrogen and oxygen containing gas, forming an interfacial layer of aluminum, nitrogen and oxygen on the first aluminum layer; thereafter removing the polysilicon layer from the second dummy gate, resulting in a second gate trench; and forming a second metal layer and a second aluminum layer on the second metal layer in the second gate trench.
申请公布号 US2011156166(A1) 申请公布日期 2011.06.30
申请号 US20090651017 申请日期 2009.12.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG KUO BIN;LI SSU-YI;CHEN RYAN CHIA-JEN;YANG CHI-MING;CHERN CHYI SHYUAN;LIN CHIN-HSIANG
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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