发明名称 MACRO MODEL STRUCTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A macro model structure of a semiconductor device is provided to improve the accuracy of an on resistance by respectively adding a parasitic resistance to a drain and a source even through the total width of an LDMSO(Laterally Double Diffused Metal Oxide Semiconductor) increases. CONSTITUTION: A macro model structure of a semiconductor device includes a first parasitic resistance(20) and a variable resistance(10) at a drain and a second parasitic resistance at a source. The variable resistance depends on a voltage between the gate and source and a voltage between the drain and source. The gate is comprised of a poly gate with a plurality of fingers. The values of the first and second parasitic resistances are set according to the surface resistance of metal connecting sources and metal connecting drains in a semiconductor, the number of fingers, the pitch between fingers, and the width of each finger.</p>
申请公布号 KR20110072145(A) 申请公布日期 2011.06.29
申请号 KR20090128968 申请日期 2009.12.22
申请人 DONGBU HITEK CO., LTD. 发明人 LEE, JONG SUB
分类号 H01L29/78 主分类号 H01L29/78
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