Testing method of an IC card including a Zigbee device

摘要

The present invention relates to method for testing a ZigBee device (2a) included in an IC Card (1a), comprising the following steps: associating a predetermined PAN (Personal Area Network) Identificator (3a) to the ZigBee device (2a); providing a test device (4) which initializes a ZigBee network; connecting the ZigBee device (2a) to the ZigBee network and transmitting the corresponding PAN Identificator (3a) to the test device (4), the method returning a fault message, indicative of a failure of said step of connecting and transmitting, if the test device (4) does not receive the PAN Identificator (3a). The method provides to pre-store the predetermined PAN Identificator (3a) in a memory portion (6) of the test device (4) and to include, in the fault message, the PAN Identificator (3a) pre-stored in the memory portion (6), if the test device (4) does not receive the PAN Identificator (3a), in order to identify the ZigBee device (2a) as a defective device.